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Equipment / Inorganic Synthesis and Electrochemistry Laboratory

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    NT-MDT INTEGRA Prima Atomic Force Microscope

    Scanning probe equipment which can achieve nanometer resolution, it is able to acquire topographical images in modes of Contact, Semi-Contact and Non-Contact (ideal for multistep techniques). By multistep technique, magnetic measurements (MFM), electrical (EFM), Kelvin Probe Microscopy (KPM) and Lateral Force Microscopy (LFM) can be performed. Notably, the team is designed to be adaptable to measurements of scanning tunneling microscopy (STM) reaching resolutions at the atomic level. It can also be adapted as a Near Field Optical Microscope (SNOM).

    This equipment is suitable for the study of compositions of both organic and inorganic materials at nanoscale.

    Workplace: Departamento de Química, Facultad de Ciencias, Universidad de Chile. Las Palmeras # 3425, Ñuñoa, Santiago, Chile.

    Coordinator: Roberto Millán Villarroel Bolcic · · 00

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