The SEM Electron Microscopy service makes it possible to observe and analyze the morphology, texture and topography of a wide variety of organic and inorganic materials in great detail.
This technique is especially useful for studying surfaces, structures, particle sizes, defects and micro- and nanoscale features that cannot be identified using conventional methods.
The results support research, development and quality control processes, providing accurate information for the advanced characterization of samples in different scientific and technological fields.